Analysis of thin baked-on silicone layers by FTIR and 3D-Laser Scanning Microscopy
DOI: 10.1016/j.ejpb.2015.08.009Author: Stefanie Funke et al.Published: 2015-10

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DOI: 10.1016/j.ejpb.2015.08.009Author: Stefanie Funke et al.Published: 2015-10

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    Title: Analysis of thin baked-on silicone layers by FTIR and 3D-Laser Scanning Microscopy
    Journal: European Journal of Pharmaceutics and Biopharmaceutics
    Authors: Stefanie Funke, Julia Matilainen, Heiko Nalenz, Karoline Bechtold-Peters, Hanns-Christian Mahler, Wolfgang Friess
    Date: 2015-10
    DOI: 10.1016/j.ejpb.2015.08.009
    Source: Elsevier BV
    Source URL: https://doi.org/10.1016/j.ejpb.2015.08.009

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