DFT AI: Machine Learning-Guided Test Point Insertion for Pre-Silicon Debug and Post-Silicon Diagnosis in Complex VLSI Systems
DOI: 10.1109/icaic67076.2026.11395827Author: Deepika BhatiaPublished: 2026-2-18

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DOI: 10.1109/icaic67076.2026.11395827Author: Deepika BhatiaPublished: 2026-2-18

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  • March 27, 2026 at 10:22 am #304
    987544pwpadminXavier
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    Title: DFT AI: Machine Learning-Guided Test Point Insertion for Pre-Silicon Debug and Post-Silicon Diagnosis in Complex VLSI Systems
    Author: Deepika Bhatia
    DOI: 10.1109/icaic67076.2026.11395827
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